Yuhyun Ji¹, Sang Mok Park¹, *Young L. Kim¹ (1. Purdue University (United States of America))

*Sirajit Rayanasukha¹, Armote Somboonkaew¹, Sarun Sumriddetchkajorn² (1. Spectroscopic and Sensing Devices Res. Group, National Electronics and Computer Tech. Center, NSTDA (Thailand), 2. National Electronics and Computer Tech. Center, NSTDA (Thailand))

*Moritsugu Sakamoto^1,4, Nhan Thanh Huynh¹, Yuki Ono¹, Kimitaka Doi¹, Kohei Noda^1,4, Tomoyuki Sasaki^1,4, Masayuki Tanaka^2,4, Nobuhiro Kawatsuki^3,4, Hiroshi Ono^1,4 (1. Nagaoka Univ. of Tech. (Japan), 2. OPT Gate Co., Ltd. (Japan), 3. Univ. of Hyogo (Japan), 4. CREST, JST (Japan))

*Shouhei Koyama¹, Tatsuya Yoda¹ (1. SHINSHU Univ. (Japan))

*Pritam P Shetty¹, Jayachandra Bingi¹ (1. IIITDM Kancheepuram (India))