*Suguru Yamaoka¹, Nikolaos Panteleimon Diamantopoulos¹, Hidetaka Nishi¹, Takuro Fujii¹, Koji Takeda¹, Tatsurou Hiraki¹, Takuma Tsurugaya¹, Shigeru Kanazawa², Hiromasa Tanobe², Takaaki Kakitsuka¹, Tai Tsuchizawa¹, Fumio Koyama³, Shinji Matsuo¹ (1. NTT Device Technology Labs (Japan), 2. NTT Device Innovation Center (Japan), 3. Laboratory for Future Interdisciplinary Research of Science and Technology, Tokyo Institute of Technology (Japan))

*Naoki Takahashi¹, Weicheng Fang¹, Ruihao Xue¹, Shunto Katsumi¹, Yoshitaka Ohiso¹, Tomohiro Amemiya^1,2, Nobuhiko Nishiyama^1,2 (1. Dept. of Electrical and Electronic Eng., Tokyo Tech (Japan), 2. Inst. of Innovative Research, Tokyo Tech (Japan))

*Abdulaziz E. Elfiqi¹, Dawei Yu², Haifeng Shao², Takuo Tanemura¹, Yoshiaki Nakano¹ (1. The University of Tokyo (Japan), 2. Hisilicon OptoElectronics Co., Ltd. (China))

*Chensheng Wu¹, Kento Komatsu¹, Rihoko Tsuchiya¹, Takuo Tanemura¹, Yoshiaki Nakano¹ (1. Univ. of Tokyo (Japan))

*Stijn Cuyvers^1,2, Artur Hermans^1,2,3, Stijn Poelman^1,2, Camiel Op de Beeck^1,2, Bahawal Haq^1,2, Gunther Roelkens^1,2, Kasper Van Gasse^1,2,4, Bart Kuyken^1,2 (1. Ghent University - Imec (Belgium), 2. Center for Nano- and Biophotonics (Belgium), 3. Research Lab. of Electronics, MIT (United States of America), 4. E. L. Ginzton Lab., Stanford University (United States of America))