CLEO-PR2022/ISOM'22/ODF'22

講演情報

Oral Session

CLEO-PR2022 » Interferometric Sensing

[CFA17G] Interferometric Sensing

2022年8月5日(金) 09:15 〜 10:15 Room 104&105 (1F)

Session Chairs: Hideaki Haneishi (Chiba Univ.), Young L. Kim (Purdue Univ.)

09:15 〜 09:30

[CFA17G-02] An instance hole measurement using a low-coherence interferometer with a high repetition rate during laser-welding process

*Neisei HAYASHI1, Takuma FUJITA2, Takahiro DEGUCHI2, Ryo NOMURA2, Hiroshi HASEGAWA2, Takeshi MAKINO3, Takahiro HASHIMOTO3, Hideaki FURUKAWA3, Naoya WADA3, Katsuhiro ISHII1 (1. GPI (Japan), 2. Nadex Products Co., Ltd. Laser R&D Center (Japan), 3. NICT (Japan))

[Presentation Style] Onsite

The shape of an instance hole (keyhole) created via a high-power laser was measured using a low-coherence interferometer with a 10-MHz repetition rate, a 10-um absolute spatial resolution and a 5-mm measurement range.