Out-of-the-laboratory transfer of an optical sensor: inspection of dielectric thin films on industrial rough aluminum

Yannic Toschke

Presentation information

Oral Session

CLEO-PR2022 » Interferometric Sensing

[CFA17G] Interferometric Sensing

Fri. Aug 5, 2022 9:15 AM - 10:15 AM Room 104&105 (1F)

Session Chairs: Hideaki Haneishi (Chiba Univ.), Young L. Kim (Purdue Univ.)

9:45 AM - 10:00 AM

[CFA17G-04] Out-of-the-laboratory transfer of an optical sensor: inspection of dielectric thin films on industrial rough aluminum

*Yannic Toschke¹, Bjoern Bourdon¹, Mirco Imlau¹ (1. Osnabrueck University (Germany))

[Presentation Style] Online

We demonstrate a novel interference based optical sensor for the inspection of trivalent chromium conversion coatings on cold-rolled aluminum. The focus is placed on an out-of-the-laboratory, open-source prototype employing the emerging field of 3D-printing.