CLEO-PR2022/ISOM'22/ODF'22

講演情報

Oral Session

CLEO-PR2022 » Comb Metrology II

[CThA6D] Comb Metrology II

2022年8月4日(木) 11:00 〜 12:00 Room 204 (2F)

Session Chair: Takashi Kato (Univ. of Electro-Communications)

11:45 〜 12:00

[CThA6D-04] Phase Sensitive Surface Profile Measurement Using Swept Multigigahertz Supercontinuum Comb

*Samuel Choi1,4, Takuro Yamazaki1, Hiroshi Hibino2,4, Takamasa Suzuki1, Tatsutoshi Shioda3 (1. Niigata Univ. (Japan), 2. Osaka Univ. (Japan), 3. Saitama Univ. (Japan), 4. AMED-CREST, AMED (Japan))

[Presentation Style] Online

A full-field surface profiling technique using a frequency-tunable supercontinuum multi-gigahertz comb was proposed and demonstrated simultaneous amplitude and phase detection. Depth resolution was 30 µm and displacement accuracy of the measured plane was 19 nm.