*Omar Florez1,2, Guillermo Arregui1, Marcus Albrechtsen3, Ryan C. Ng1, Jordi Gomis1, Soren Stobbe3, Clivia Marfa Sotomayor1,4, Pedro David Garcia1
(1. Catalan Institute of Nanoscience and Nanotechnology (Spain), 2. Dept. de Física, Universitat Autònoma de Barcelona (Spain), 3. Department of Photonics Engineering, DTU Fotonik, Technical University of Denmark (Denmark), 4. Institució Catalana de Recerca i Estudis Avançats (ICREA) (Spain))
[Presentation Style] Onsite
We measure two GHz guided modes in a line defect waveguide fabricated in silicon on insulator (SOI), using Brillouin light scattering spectroscopy.