[CThP6F] Advanced Comb Sources and Applications

[CThP6F-07] Electro-optical Dual-Comb Spectroscopy: Application to Cavity Ring-Down, Mode Width and Mode Dispersion Measurements

Dominik Charczun¹, Daniel Lisak¹, Akiko Nishiyama^1,2, Thibault Voumard³, Thibault Wildi³, Grzegorz Kowzan¹, Victor Brasch⁴, Tobias Herr^3,6, Adam J. Fleischer⁵, Joseph T. Hodges⁵, Roman Ciuryło¹, Agata Cygan¹, *Piotr Maslowski¹ (1. Institute of Physics, Nicolaus Copernicus University in Torun (Poland), 2. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (Japan), 3. Deutsches Elektronen-Synchrotron DESY (Germany), 4. CSEM - Swiss Center for Electronics and Microtechnology (Switzerland), 5. Optical Measurements Group, National Institute of Standards and Technology (United States of America), 6. Physics Department, Universität Hamburg UHH (Germany))

[Presentation Style] Onsite

The advantages of dual-comb spectroscopy with the sensitivity of cavity-enhanced techniques has been combined in a new broadband approach. The experimental demonstration is completed by a comprehensive theoretical framework, underlining the potential of the techniques.