1:45 PM - 2:00 PM
[CTuP3C-02] Development of Terahertz Time-Domain Rotating-Analyzer Ellipsometry
[Presentation Style] Onsite
High-precision terahertz (THz) time-domain ellipsometry is developed. The rotating-analyzer technique is newly applied through phase component correction based on the analysis of the THz field amplitude as a function of analyzer angle.