[CWP19B] X-ray Lasers and Their Applications II

[CWP19B-01 (Invited(P))] XFEL single-nanometer focusing system at SACLA

*Jumpei Yamada^1,2, Satoshi Matsuyama³, Takato Inoue², Atsuki Ito², Ichiro Inoue¹, Taito Osaka¹, Yuichi Inubushi⁴, Hirokatsu Yumoto^4,1, Takahisa Koyama^4,1, Haruhiko Ohashi^4,1, Kazuto Yamauchi², Makina Yabashi^1,4 (1. RIKEN SPring-8 Center (Japan), 2. Osaka University (Japan), 3. Nagoya University (Japan), 4. JASRI (Japan))

[Presentation Style] Onsite

A sub-10 nm focusing system for the XFEL has been developed using advanced Kirkpatrick-Baez mirrors based on Wolter-type III geometry.