[OFA3A] Optical Systems I

[OFA3A-02] Coded Exposure Imaging System for Crack Inspection

*Yasuhito Hashiba¹, Keita Mochizuki¹, Emiko Sano¹, Shigeru Takushima¹, Hiroyuki Kawano¹, Hajime Nagahara² (1. Mitsubishi Electric Corporation (Japan), 2. Osaka University Institute for Datability Science (Japan))

[Presentation Style] Onsite

We developed a crack inspection system that applied coded exposure photography. The results of field experiments in a tunnel demonstrated that our system detected 0.3-mm wide cracks when moving at 80 km/h.