[P-CTh6] C6. Optical and Photonic Metrology

[P-CTh6-17] [No-show] Wide-bandgap Semiconductors Testing and Oscillatory Stresses Detection Using the Non-steady-state Photo-EMF Technique

*Igor Sokolov¹, Mikhail Bryushinin¹ (1. Ioffe Institute (Russia))

The non-steady-state photoelectromotive force is excited in beta-Ga₂O₃ and SiC crystals. The photoelectric parameters of these materials are determined and detection of mechanical oscillations in a fiber optic plate is demonstrated.