The 74th Divisional Meeting of DCSC

Exhibitors' information

[4] NanoAndMore Japan K.K.

NanoAndMore Japan K.K.

NanoAndMore Japan was established in 2019 as a Japanese company of the NanoWorld holding group, which specializes in manufacturing and selling probes for atomic force microscopes and scanning probe microscopes. We offer wide variations for various measurement modes of commercial AFMs and SPMs. We can also propose products that match your budget, from high-quality products to cost-focused products. We offer everything from standard AFM measurements to special probes such as various colloid probes or high-speed AFM probes. We also offer peripheral equipment such as sample support substrate for AFM and SPM, acoustic enclosure, and soundproof panels.
https://www.nanoandmore.jp
 
<Product example> ______________________
□ Colloid probe
Cantilever with a colloid attached to the free end of the cantilever. The contact area between the probe and the sample can be well-defined, and molecular modification is also possible. It is ideal for nanoindentation and nanoscale viscoelasticity measurement of polymers or bio-samples, for which AFM and SPM are increasingly being applied. Colloid material and size can be selected according to your application.
https://www.nanoandmore.jp/Sphere-Nanomechanics-AFM-Probes
 
■ sQube CP series
A colloid is glued on a tipless cantilever. Various colloid materials and colloid sizes are available.
■ nanotools biosphere series
With a high-density carbon colloid on a tip of ordinary cantilever
■NanoSensors SD-sphere series
With a SiO2 colloid on a tip of ordinary cantilever
 
□Tipless cantilever
It is a cantilever-only probe without a tip. You can use it when you attach colloids by yourself or perform molecular modification.
https://www.nanoandmore.jp/Tipless-AFM-Cantilevers-Cantilever-Arrays
 
□ Soft cantilever for measurement in liquid
https://www.nanoandmore.jp/Silicon-Nitride-AFM-Probes https://www.nanoandmore.jp/AFM-Probe-BL-AC40TS
These cantilevers are for bio samples and biomaterials that require very soft and delicate measurements. A special cantilever with an extremely soft spring constant is required for sample surface topography measurements and viscoelasticity measurements of soft materials, which have been increasingly requested by customers in recent years.
 
In addition, we also have many versatile Tapping mode probes and contact mode probes or Coating products such as gold coating and diamond coating are also available. Please check the lineup on the NanoAndMore Japan website.
 
 
□ Acoustic enclosure
Air vibrations coming from air conditioners, airflows, pumps, etc. around atomic force microscopes and scanning probe microscopes can cause noise. Placing the AFM, SPM system on a stable table and enclosing it into Acoustic enclosure, the noise caused by air vibrations will be decreased, resulting in better measurements.
https://www.nanoandmore.jp/AFM-Accessories-Enclosures
  • Address

    341-0018
    #201 KTT5Bldg., 1-1-1 Waseda, Misato-shi, Saitama 341-0018 JAPAN

  • Tel

    048-951-0958

  • Fax

    048-951-0959

  • Web site, SNS

    https://www.nanoandmore.jp/