[Q6] 6. 固体表面と濡れ・吸着・接着

[Q6-19] Characterising thin films by neutron/X-ray/light scattering: A brief history of refellips and refnx analysis tools

*Hayden Robertson¹, Isaac J. Gresham², Stuart W. Prescott³, Grant B. Webber¹, Erica J. Wanless¹, Andrew R.J. Nelson⁴ (1. University of Newcastle (Australia), 2. University of Sydney (Australia), 3. UNSW Sydney (Australia), 4. Australian Centre for Neutron Scattering ANSTO (Australia))

キーワード：ellipsometry, corefinement, neutron reflectometry, analysis, modelling, x-ray reflectometry