Chung Liang Chang¹, *Chi Yao Wu¹, Chun Chen Yang¹, Jer Huan Jang¹ (1. Ming-Chi University of Technology)

*Kazuaki Kisu¹, Etsuro Iwama¹, Yuki Orikasa², Wako Naoi³, Philippe Leone⁴, Nicolas Dupré⁴, Thierry Brousse⁴, Patrick Rozier⁵, Patrice Simon⁵, Katsuhiko Naoi^1,6 (1. Tokyo University of Agriculture and Technology, 2. Ritsumeikan University, 3. K & W Inc., 4. Institut des Matériaux Jean Rouxel, CNRS/Polytech Nantes, 5. CIRIMAT-CNRS, University of Toulouse III Paul Sabatier, 6. Advanced Capacitor Research Center)

*Naohisa Okita¹, Kazuaki Kisu^1,2, Yuki Sakai¹, Yiyo Lim¹, Yusuke Takami¹, Thierry Brousse^2,3, Patrick Rozier^2,4, Patrice Simon^2,4, Wako Naoi⁵, Katsuhiko Naoi^1,2,6 (1. Tokyo University of Agriculture and Technology, 2. Global Innovation Research Organization, 3. University of Nantes, 4. Paul Sabatier University, 5. K & W Inc., 6. Advanced Capacitor Research Center)

Yesheng Shang¹, *Aishui Yu¹ (1. Fudan University)

*Congcong Zhang¹, Junming Su¹, Chunguang Chen¹, Siyang Liu¹, Tao Huang¹, Aishui Yu¹ (1. Fudan University)

*Ho Seok Park¹ (1. Sungkyunkwan University)

*Prerre-Louis Taberna¹, K Brousse^1,2, S Nguyen³, S Pinaud³, C Lethien^2,4, B Chaudret³, M Respaud³, P Simon^1,2 (1. Universite Paul Sabatier, CIRIMAT UMR CNRS, 2. Réseau sur le Stockage Electrochimique de lEnergie, 3. Université de Toulouse, 4. Université Lille 1 Sciences et Technologies)