ICPE2020

Presentation information

Oral Sessions

B-2 Advanced grinding technologies

[B-2-4] Investigation of Crystallographic Aspects of Subsurface Damage Induced by Grinding Using Micro Raman Tomographic Imaging

〇Teppei Onuki1, Shunsuke Kan1, Wanpiao Lin1, Wentong Lu1, Kousuke Hasegawa1, Hirotaka Ojima1, Jun Shimizu1, Libo Zhou1 (1.Ibaraki University)

Keywords:Measurement、Sapphire、Raman scattering spectroscopy、Nondestructive measurement、Subsurface damage