Investigation of Crystallographic Aspects of Subsurface Damage Induced by Grinding Using Micro Raman Tomographic Imaging

[B-2-4] Investigation of Crystallographic Aspects of Subsurface Damage Induced by Grinding Using Micro Raman Tomographic Imaging

〇Teppei Onuki¹、Shunsuke Kan¹、Wanpiao Lin¹、Wentong Lu¹、Kousuke Hasegawa¹、Hirotaka Ojima¹、Jun Shimizu¹、Libo Zhou¹ (1.Ibaraki University)

キーワード：Measurement、Sapphire、Raman scattering spectroscopy、Nondestructive measurement、Subsurface damage