ICPE2020

講演情報

Oral Sessions

D-1 Nano-scale measurements and calibrations

[D-1-14] Development of Apparatus for In-line Total Inspection of Burr and Dimension

Tatsuki Otsubo1、〇Wang Jingwei1、Takanori Yazawa1、Yosuke Miyazaki2 (1.Nagasaki University、2.YANMAR HOLDINGS CO., LTD.)

キーワード:Measurement、In-line Inspection、Spatial Frequency Filter