D-1 Nano-scale measurements and calibrations

[D-1-15] Spatial-frequency-based evaluation of image reconstruction by structured-illumination microscopy with deep learning

〇Ren Ichikawa¹, Hiromasa Kume¹, Masatoshi Nishikawa², Shotaro Kadoya¹, Masaki Michihata¹, Kiyoshi Takamasu¹, Satoru Takahashi¹ (1.The University of Tokyo, 2.Hosei University)

Keywords:Measurement、Super-resolution、Structured Illumination Microscopy、Deep Learning、Nano-Structured Substrate