D-1 Nano-scale measurements and calibrations

[D-1-15] Spatial-frequency-based evaluation of image reconstruction by structured-illumination microscopy with deep learning

〇Ren Ichikawa¹、Hiromasa Kume¹、Masatoshi Nishikawa²、Shotaro Kadoya¹、Masaki Michihata¹、Kiyoshi Takamasu¹、Satoru Takahashi¹ (1.The University of Tokyo、2.Hosei University)

キーワード：Measurement、Super-resolution、Structured Illumination Microscopy、Deep Learning、Nano-Structured Substrate