ICPE2020

Presentation information

Oral Sessions

D-1 Nano-scale measurements and calibrations

[D-1-5] Detection of Surface Roughness by Ellipsometry based on Spin Hall Effect of Light

〇Zhehan Li1, Yasuhiro Mizutani1, Yasuhiro Takaya1 (1.Osaka University)

Keywords:Measurement、spin Hall effect of light、ellipsometry、surface roughness、weak measurement