Electrically Detected Electron Nuclear Double Resonance in 4H-SiC Bipolar Junction Transistors

Presentation information

Oral Presentation

Characterization and Defect Engineering

Fri. Oct 4, 2019 1:00 PM - 2:15 PM Annex Hall 2 (Kyoto International Conference Center)

1:15 PM - 1:30 PM

*Ryan J. Waskiewicz¹, Brian R. Manning¹, Duane J. McCrory¹, Patrick M. Lenahan¹ (1. The Pennsylvania State Univ.(United States of America))