[Fr-3B] Device-related Characterization

[Fr-3B-02] Electrically Detected Electron Nuclear Double Resonance in 4H-SiC Bipolar Junction Transistors

*Ryan J. Waskiewicz¹, Brian R. Manning¹, Duane J. McCrory¹, Patrick M. Lenahan¹ (1. The Pennsylvania State Univ.(United States of America))