Investigation of Bipolar Degradation of the Base-Collector-Diode of 1.2 kV BJTs under Different Current and Temperature Conditions

講演情報

Oral Presentation

Characterization and Defect Engineering

2019年10月4日(金) 13:00 〜 14:15 Annex Hall 2 (Kyoto International Conference Center)

13:30 〜 13:45

*Sarah Rugen¹, Nando Kaminski¹, Siddarth Sundaresan², Ranbir Singh² (1. Univ. of Bremen(Germany), 2. GeneSiC Semiconductor(United States of America))