[Th-1A] Testing and Radiation

[Th-1A-04] New Insight into Single-Event Radiation Failure Mechanisms in Silicon Carbide Power Schottky Diodes and MOSFETs

*Arthur Witulski¹, Robert A. Johnson¹, Scooter R. Ball¹, Michael L. Alles¹, Robert A. Reed¹, Ronald D. Schrimpf¹, John M. Hutson³, Arto Javanainen, Jean-Marie Lauenstein² (1. Vanderbilt Univ.(United States of America), 2. National Institute of Aeronautics and Aerospace(United States of America), 3. Lipscomb Univ. (United States of America))