[Th-1B] Extended Defects II

[Th-1B-02] From wafers to bits and back again: using deep learning to accelerate the development and characterization of SiC material

*Robert T Leonard¹, Matthew Conrad¹, Edward Van Brunt¹, Jeffrey Giles¹, Alexander K Shveyd¹, Elif Balkas¹ (1. Wolfspeed(United States of America))