ICSCRM2019

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Oral Presentation

Characterization and Defect Engineering

[Th-1B] Extended Defects II

Thu. Oct 3, 2019 8:45 AM - 10:15 AM Annex Hall 2 (Kyoto International Conference Center)

10:00 AM - 10:15 AM

[Th-1B-05] 2D extended defects interaction: the case of grain boundary and stacking faults in 3C-SiC

*Massimo Zimbone1, Corrado Bongiorno1, Cristiano Calabretta2, Francesco La Via1 (1. CNR-Inst. for Microelectronics and Microsystems (Italy)(Italy), 2. MIFT, Univ. degli studi di Messina(Italy))