[Th-P] Poster Presentation

[Th-P-14] Verification of Forward Degradation in PiN Diode Using Free-Standing 4H-SiC Epitaxial Layers

*Yusuke Miyata¹, Hiroaki Okabe¹, Tomoaki Furusho¹, Kazuya Konishi¹, Kenji Hamada¹, Hiroshi Watanabe¹, Shingo Tomohisa¹, Naruhisa Miura¹ (1. Mitsubishi Electric Corp.(Japan))