[Th-P] Poster Presentation

[Th-P-42] Effects of Pulsed and DC Body Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics

*Ronald Green Green¹, Aivars J Lelis¹, Franklin L Nouketcha^1,2 (1. U.S. Army Research Laboratory(United States of America), 2. University of Maryland(United States of America))