ICSCRM2019

講演情報

Oral Presentation

Characterization and Defect Engineering

[Tu-3B] Quantum Technology II

2019年10月1日(火) 13:45 〜 15:45 Annex Hall 2 (Kyoto International Conference Center)

15:00 〜 15:15

[Tu-3B-05] Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions

*Matthias Niethammer1, Matthias Widmann1, Torsten Rendler1, Naoya Morioka1, Yu Chen Chen1, Rainer Stöhr1, Jawad al Hassan2, Shinobu Onoda6, Takeshi Ohshima6, Sang-Yun Lee3, Amlan Mukherjee1, Junichi Isoya4, Nguyen Tien Son2, Jörg Wrachtrup1,5 (1. 3rd Inst. of Physics and Center for Applied Quantum Tech., Univ. of Stuttgart(Germany), 2. Department of Physics, Chemistry and Biology, Linköping Univ.(Sweden), 3. Center for Quantum Info., Korea Inst. of Sci. and Tech. Seoul(Korea), 4. Faculty of Pure and Applied Sci., Univ. of Tsukuba(Japan), 5. Max Planck Inst. for Solid State Res., Stuttgart(Germany), 6. National Inst. for Quantum and Radiological Sci. and Tech.(Japan))