[Tu-P] Poster Presentation

[Tu-P-17] Investigation of dislocations inducing leakage currents on SiC junction barrier schottky diode by two-photon-excited band-edge photoluminescence

*Yosuke Nakanishi¹, Tomoaki Noguchi¹, Takuyo Nakamura¹, Masaaki Ikegami¹, Kazuo Kobayashi¹, Kazuya Konishi¹, Kohei Ebihara¹ (1. Mitsubishi Electric Corp.(Japan))