[Tu-P] Poster Presentation

[Tu-P-19] Impact of threading dislocations detected by KOH etching on 4H-SiC 650 V MOSFET device failure after reliability test

*Andrea Severino¹, Ruggero Anzalone¹, Nicolo' Piluso¹, Cirino Rapisarda¹, Alfio Russo¹, Beatrice Carbone¹, Santi Alessandrino¹, Salvo Coffa¹ (1. STMicroelectronics(Italy))