Tue. Oct 1, 2019 4:15 PM - 6:15 PMAnnex Hall 1 (Kyoto International Conference Center)
Schedule
1
4:15 PM - 6:15 PM
[Tu-P-43] Analyzing 4H-SiC JBS diodes by TCAD process simulation using accurate implantation conditions
*Jonas Buettner1, Susanne Beuer1, Silke Petersen1, Tobias Erlbacher1, Anton Bauer1(1. Fraunhofer Institute for Integrated Systems and Device Technology IISB(Germany))