Schedule 0 4:15 PM - 6:15 PM [Tu-P-45] Evaluation of SiC-MOSFET by Repetitive UIS Tests for Solid State Circuit Breaker *Mitsuhiko Sagara1, Keiji Wada1, Shin-ichi Nishizawa2 (1. Tokyo Metropolitan Univ.(Japan), 2. Kyushu Univ.(Japan))
