Investigation into the Body Diode Degradation of 6.5 kV SiC MOSFETs

Presentation information

Poster Presentation

Tue. Oct 1, 2019 4:15 PM - 6:15 PM Annex Hall 1 (Kyoto International Conference Center)

4:15 PM - 6:15 PM

*Enea Bianda¹, Andrei Mihaila¹, Gianpaolo Romano¹, Lars Knoll¹, Stephan Wirths¹, Daniele Torresin¹ (1. ABB(Switzerland))