Schedule 3 9:30 AM - 9:45 AM [We-1B-03] Experimental Study on Mitigation of Lifetime-Limiting Dielectric Cracking in Extreme Temperature 4H-SiC JFET Integrated Circuits *David J Spry1, Philip G Neudeck1, Carl W Chang2 (1. NASA(United States of America), 2. Vantage Partners LLC(United States of America))
