[We-1B] High Temperature and IC

[We-1B-03] Experimental Study on Mitigation of Lifetime-Limiting Dielectric Cracking in Extreme Temperature 4H-SiC JFET Integrated Circuits

*David J Spry¹, Philip G Neudeck¹, Carl W Chang² (1. NASA(United States of America), 2. Vantage Partners LLC(United States of America))