ICSCRM2019

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Oral Presentation

Characterization and Defect Engineering

[We-3B] Fundamental Physics and Measurement Techniques

Wed. Oct 2, 2019 1:45 PM - 3:45 PM Annex Hall 2 (Kyoto International Conference Center)

3:30 PM - 3:45 PM

[We-3B-07] Photocurrent induced by Franz-Keldysh effect in 4H-SiC p-n junction diodes under high electric field along <11-20> direction

*Takuya Maeda1, Xilun Chi1, Hajime Tanaka1, Masahiro Horita1,2, Jun Suda1,2, Tsunenobu Kimoto1 (1. Kyoto University(Japan), 2. Nagoya University(Japan))