IVC-22

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Parallel Sessions

Scanning Probe Microscopy

[Mon-C2] Scanning Probe Microscopy

Mon. Sep 12, 2022 3:30 PM - 5:30 PM Room C (Mid-sized Hall A)

3:30 PM - 3:45 PM

[Mon-C2-1] AFM-based Nanomechanics on Thermoplastic Elastomers

*Ken Nakajima1, Haonan Liu1, Xiaobin Liang1 (1. Tokyo Institute of Technology (Japan))

Keywords:Atomic Force Microscopy, Thermoplastic Elastomer, Nanomechanics, Finite Element Analysis

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