[Mon-C2] Scanning Probe Microscopy

[Mon-C2-1] AFM-based Nanomechanics on Thermoplastic Elastomers

*Ken Nakajima¹, Haonan Liu¹, Xiaobin Liang¹ (1. Tokyo Institute of Technology (Japan))

キーワード：Atomic Force Microscopy, Thermoplastic Elastomer, Nanomechanics, Finite Element Analysis