[Thu-D1] Vacuum Science and Technology -- Vacuum Measurements, Diagnostics

[Thu-D1-6] Evaluating low Pressure Resolution Limits for Optical Refractometry

*Jacob Ricker¹, Kevin Douglass¹, Jay Hendricks¹, Sarah White², Sergei Syssoev² (1. National Institute of Standard and Technology (NIST) - USA (United States of America), 2. MKS Instruments Inc., Andover, MA USA (United States of America))

キーワード：standard, Refractometry, Gas Pressure