12:30 PM - 2:00 PM
[R3-P-04] Determination of the stability of silica phases under high pressure by ultra-fast X-ray diffraction measurements
Keywords:SiO2, high pressure and high temperature, X-ray diffraction measurement, seifertite
Poster presentation
Thu. Sep 12, 2024 12:30 PM - 2:00 PM Entrance Hall (Higashiyama Campus)
12:30 PM - 2:00 PM
Keywords:SiO2, high pressure and high temperature, X-ray diffraction measurement, seifertite