R3: High-pressure science and deep Earth’s material

[R3-P-04] Determination of the stability of silica phases under high pressure by ultra-fast X-ray diffraction measurements

*Ryosuke SINMYO¹, Saori Kawaguchi-Imada², Takayuki Ishii³, Hiroshi Sakuma⁴, Ayase Ogawa¹, Kenta Kobayashi¹, Shuhou Maitani¹ (1. Meiji Univ. Sci. Tech., 2. JASRI, 3. Okayama Univ. IPM, 4. NIMS)

Keywords:SiO2, high pressure and high temperature, X-ray diffraction measurement, seifertite