*Hiroyuki Nakata¹, Yuhei Oki², Kenro Nozaki³, Keisuke Hosokawa³, Ichiro Tomizawa³, Ryo Matsushima³, Kumiko K. Hashimoto⁴, Toshiaki Takano¹, Hiroyo Ohya¹ (1.Graduate School of Engineering, Chiba University, 2. Department of Electrical and Electronics Engineering, Faculty of Engineering, Chiba University, 3.The University of Electro-Communications, 4.Kibi International University)