Japan Geoscience Union Meeting 2021

Exhibitors' information

ZEISS

ZEISS

Introduction of ZEISS Microscopy 
ZEISS is proud to celebrate its heritage of the longest history in geoscience imaging of any company. From micropaleontology to mineralogical studies, technologies such as X-ray microanalysis and cathodoluminescence along with advances in scanning electron microscopy are extending your research capabilities today and tomorrow.

We will be participating in the Quiz Rally, come join us to win amazing prizes!
Solutions
1. Discover the new possibilities of automated petrography with ZEISS Axioscan 7 
Digitize your thin sections with Axioscan 7 – the reliable, reproducible way to create high quality, digitized petrography data in transmitted and reflected light

 

2. Automate Your Mineralogy to Increase Productivity with Mineralogic
ZEISS Mineralogic is the ideal solution for exacting geological interrogation of your samples, from in-depth petrological investigations to high throughput mineral liberation workflows                                                


3. Diffraction Contrast Tomography Module for X-Ray Microscopy 
Laboratory Diffraction Contrast Tomography (LabDCT) is a unique grain imaginganalytical technology, enabling thenon-destructive mapping of orientation and microstructure in 3D. It is the first-ever laboratory-based diffraction contrast tomography imaging module, obtaining 3D crystallographic information from polycrystalline samples.

 

4. Discover the Unknown with Ultimate Imaging and Effortless Analytics with ZEISS GeminiSEM
ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. Take sub-nanometer images below 1 kV without an immersion lens. Explore, how the GeminiSEM family answers all your imaging and analytical needs. ​

 
ZEISS Seminar Talk: “Digital Petrology”: How automation and digitalization is revolutionizing microscopy based petrographic studies 
Timing of Session: 3rd June 2021, 10:45-11:30 
 
Abstract
In 1851, Henry Sorby (Sheffield, England) laid the foundations of microscopy-based petrography. The innovation was the use of two Nicol-prisms to be able to study a slice of rock with polarized light. The second level of foundations of microscopy-based petrography occurred sometime after the 1965 introduction of commercial Scanning Electron Microscopy (SEM) by Sir Charles Oatley (Cambridge, England). Since these innovations established the “foundations of petrography”, there has been little technological innovation to address some of the challenges in microscopy-based petrography. These challenges can be summarized as the following:
1. Sampling bias and sample heterogeneity
2. Resolutions vs Field of View (FoV)
3. Unable to quantify and therefore a subjective technique

In this presentation innovations and the development of “Digital Petrography” technology can:

1. Automated data acquisition of 10’s – 100’s of thin sections in Light and Electron Microscopy. This enables high resolution and large area digitization to solve the “resolution vs FoV” challenge and understanding heterogenous samples.

2. Classification of the mineralogy and quantification to product modal mineralogy (etc.) and thus removing subjectivity.

The innovations that are allowing Geologists to address these challenges will be discussed to understand the technological developments and their applications through multiple case studies.
 
Talk to a ZEISS Specialist
Join us at the popup session and talk to a ZEISS Specialist to answer all your questions! 
Time: 4th June 2021, 13:45 - 15:15  

Book a meeting at your convenience via Teams call
Date and Time (JST): 
6月1日(火)●11:00- ●12:00- ●15:00- ●16:00-
6月2日(水)●11:00- ●12:00- ●15:00- ●16:00-
6月3日(木)●11:00- ●12:00- ●15:00- ●16:00-
6月4日(金)●11:00- ●12:00- ●15:00- ●16:00-
Book A Session with Our Specialists Here
 
If you have further inquiries, please email us at  marketing.microscopy@zeiss.com
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  • Department

    ZEISS Research Microscopy Solutions Division

  • Address

    102-0083
    2-10-9 Kojimachi, Chiyoda-ku, Tokyo 102-0083 Japan

  • Tel

    0570-02-1310

  • Web site, SNS

    https://zeiss.ly/LINE