2:00 PM - 2:15 PM
*Philippe Baron1,2, Kohei Kawashima2, Hiroshi Hanado1, Seiji Kawamura1, Takeshi Maesaka3, Shinsuke Satoh1, Tomoo Ushio2 (1.National Institute of Information and Communications Technology (NICT), Koganei, Japan, 2.Electrical Engineering Dept., Osaka University, Japan, 3.National Research Institute for Earth Science and Disaster Resilience (NIED), Tsukuba, Japan)