Session information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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Lunch (1:00 PM - 2:30 PM)

2:30 PM - 2:45 PM

[19p-D2-1] Influence of charged samples on Scanning Ion Conductance Microscopy

^○Kimihiro Ishizaki¹, Tatsuo Ushiki², Masato Nakajima², Futoshi Iwata¹ (Shizuoka Univ.¹, Nigata Univ.²)

2:45 PM - 3:00 PM

[19p-D2-2] Electrochemical frequency modulation atomic force microscopy (EC-FM-AFM) observation of graphite electrode/aqueous solution interface

^○Toru Utsunomiya¹, Yasuyuki Yokota¹, Toshiaki Enoki², Ken-ichi Fukui¹ (Osaka Univ.¹, Tokyo Tech.²)

3:00 PM - 3:15 PM

[19p-D2-3] Structural Analysis on Ionic-liquid/Ionic-crystal Interfaces by using FM-AFM

^○Takashi Ichii¹, Masahiro Negami¹, Hiroyuki Sugimura¹ (Kyoto Univ.¹)

3:15 PM - 3:30 PM

[19p-D2-4] Investigation of hydration structures at the interface between alkali halide crystal surface and aqueous solution (2)

^○Fumiaki Ito¹, Kazuhiro Suzuki¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

3:30 PM - 3:45 PM

[19p-D2-5] Precise analysis of force maps acquired on surfactant assembly by FM-AFM (2)

^○(PC)Ken-ichi Umeda¹, Kazuhiro Suzuki¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

3:45 PM - 4:00 PM

[19p-D2-6] Ｍolecular-scale investigation of formation process of surfactant assembly by FM-AFM (2)

^○(PC)Kazuhiro Suzuki¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

4:00 PM - 4:15 PM

[19p-D2-7] Molecular-scale investigation of hydration structure of biomolecules by FM-AFM

^○(D)Zipeng Cui¹, Hiroaki Kominami¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Dept.of Electronic Sci.&Eng.,Kyoto Univ.¹, Hakubi Center,Kyoto Univ.²)

Break (4:15 PM - 4:30 PM)

4:30 PM - 4:45 PM

[19p-D2-8] Atomic resolution imaging of the local contact potential difference with kelvin probe force microscopy without the dc bias voltage

^○(M1)Ryosuke Kanbayashi¹, Lili Kou¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

4:45 PM - 5:00 PM

[19p-D2-9] Evaluation of alumina thin film by measuring contact potential deference

^○(M2)Yuta Ashida¹, Hirotaka Yokoyama¹, Yoshitaka Naitoh¹, Yan jun Ri¹, yasuhiro Sugawara¹ (Osaka Univ.¹)

5:00 PM - 5:15 PM

[19p-D2-10] Site specific surface potential measurement on Si(111)-(7×7) surface using noncontact scanning nonlinear dielectric microscopy

^○Kohei Yamasue¹, Masayuki Abe², Yoshiaki Sugimoto³, Yasuo Cho¹ (Tohoku Univ.¹, Nagoya Univ.², Osaka Univ.³)

5:15 PM - 5:30 PM

[19p-D2-11] Effect of tip polarity on Kelvin probe force microscopy

^○Yoshiaki Sugimoto¹, Ayhan Yurtsever², Masaki Fukumoto¹, Masayuki Abe³, Seizo Morita² (Osaka Univ.¹, Osaka Univ.², Nagoya Univ.³)

5:30 PM - 5:45 PM

[19p-D2-12] Cantilever holder for increasing Q factor of a cantilever

^○Kiho Isoyama¹, Eiji Arima¹, Yoshitake Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

5:45 PM - 6:00 PM

[19p-D2-13] Non-contact atomic force microscopy observation of etching of Si(111) surfaces by irradiation of atomic hydrogen

^○Tomoaki Miyagi¹, Akira Sasahara¹, Masahiko Tomitori¹, Ryohei Kokawa², Masahiro Ohta², Hirofumi Yamada³, Kei Kobayashi^3,4, Noriaki Oyabu^3,5 (JAIST.¹, Shimadzu Corp.², Dept. of Electronic Sci. &Eng.,Kyoto Univ.³, Hakubi Center, Kyoto Univ.⁴, JST.⁵)

6:00 PM - 6:15 PM

[19p-D2-14] Fabrication and Control of Pb-Atom Switch on Si(111)-(7x7) Surface

^○(PC)Eiichi Inami¹, Yoshiaki Sugimoto¹, Masayuki Abe², Seizo Morita³ (Osaka Univ.¹, Nagoya Univ.², ISIR, Osaka Univ.³)

6:15 PM - 6:30 PM

[19p-D2-15] Local Reactivity of Single-Walled Carbon Nanotubes with Different Tube Diameters, evaluated by 3D Force Field Spectroscopy

^○Makoto Ashino^1,2, Susumu Adachi², Naruo Sasaki³, Roland Wiesendanger¹ (Hamburg Univ.¹, Kanazawa Inst. Tech.², Seikei Univ.³)

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