The Development of a New Type of Transmission Electron Microscope applying Accelerator Technologies

Nao Higashi

Presentation information

Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[16a-A13-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Mon. Sep 16, 2013 9:15 AM - 12:00 PM A13 (TC1 3F-323)

9:45 AM - 10:00 AM

△ [16a-A13-3] The Development of a New Type of Transmission Electron Microscope applying Accelerator Technologies

^○Nao Higashi¹, Takaaki Furuya², Yoshisato Funahashi², Kenji Ueno², Motoaki Sawabe², Michiru Nishiwaki², Hiroshi Sakai², Shinichiro Michizono², Masao Kuriki³, Satoru Yamashita⁴, Masahiro Yamamoo², Atsushi Enomoto², Yukihide Kamiya² (The Univ. of Tokyo/Graduate School of Science¹, KEK², Hiroshima Unv./ADSM³, The Univ. of Tokyo/ICEPP⁴)

Keywords:電子顕微鏡,加速器,超伝導