[16p-A12-1~15] 2.2 Detection systems

[16p-A12-8] Material thickness estimation with the flat plane transXend detector consists of various scintillators

^○Masaru Kitahara¹, Yoshiki Yamashita¹, Tsuyoshi Ogawa¹, Masashi Kimura¹, Ikuo Kanno¹, Kentaro Fukuda², Masahiko Ohtaka³, Makoto Hashimoto³, Kuniaki Ara³, Hideaki Onabe⁴ (Kyoto Univ.¹, Tokuyama Corp.², JAEA³, Raytech Corp.⁴)

Keywords:シンチレータ,厚さ推定,transXend検出器