The 74th JSAP Autumn Meeting,2013

Presentation information

Symposium

Symposium » Challenge of next generation surface control on thehigh end semiconductor device in the industry

[16p-C11-1~12] Challenge of next generation surface control on thehigh end semiconductor device in the industry

Mon. Sep 16, 2013 1:00 PM - 5:15 PM C11 (TC3 2F-210)

4:45 PM - 5:00 PM

[16p-C11-11] Wafer normal temperature cleaner and vacuum dryer

Yoshiharu Yamamoto1 (YMT1)

Keywords:ウエーハ常温洗浄真空乾燥装置