The 74th JSAP Autumn Meeting,2013

Presentation information

Symposium

Symposium » Challenge of next generation surface control on thehigh end semiconductor device in the industry

[16p-C11-1~12] Challenge of next generation surface control on thehigh end semiconductor device in the industry

Mon. Sep 16, 2013 1:00 PM - 5:15 PM C11 (TC3 2F-210)

2:15 PM - 2:30 PM

[16p-C11-4] Mechanism of wet etching in nanoscale region (2)

Atsushi Okuyama1, Suguru Saito1, Takashi Oinoue2, Yoshiya Hagimoto2, Hayato Iwamoto2 (Sony Semiconductor1, Sony2)

Keywords:ウェットエッチング