[16p-C14-1~8] Recent development of advanced transmission electron microscopy and their share-use

[16p-C14-5] Analysis of interface and microstructure of materials by atomic resolution STEM

^○Tetsuya Tohei¹, Naoya Shibata¹, Teruyasu Mizoguchi¹, Yuichi Ikuhara^1,2 (Univ. of Tokyo¹, JFCC²)

Keywords:走査透過型電子顕微鏡,粒界・界面,ドーパント